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Texas Instruments UCC5870QEVM-045 Gate Driver Evaluation Module

Texas Instruments UCC5870QEVM-045 Gate Driver Evaluation Module (EVM) is designed for the evaluation of TI’s 15A isolated single-channel gate driver with advanced protection features. This evaluation module is targeted to drive high-power SiC MOSFETs and IGBTs in EV/HEV applications. This three-phase evaluation module can be used for debugging software for the driver’s serial peripheral interface (SPI). It can also explore the driver’s sophisticated diagnostic, protection, and monitoring features. Texas Instruments UCC5870QEVM-045 is designed to test six channels of the UCC5870-Q1 gate drivers with TI address mode SPI communication. It also has the option to configure the board for daisy chain mode SPI communication. The board can directly fit C2000 LaunchPad LAUNCHXL-F28379D, but also provides connectors for other types of controllers.

Features

15A peak split sink/source drive current for fast turn ON and turn OFF time
Driver output voltages by default are +15V/-8V with a 12V input supply
3750V_RMS one-minute isolation per UL 1577 for UCC5870-Q1
3000V_RMS one-minute isolation for the flyback transformer
> 8mm creepage distance between primary and secondary
Desat short-circuit protection and active Vce clamp
Active miller clamp using internal or external FET

Fault feedback and reset
ADC for temperature sensing and DC bus voltage sensing
Primary and secondary ASC
Address mode or daisy chain mode SPI based device reconfiguration, verification, supervision, and diagnosis
Compatible with C2000 LaunchPad LAUNCHXL-F28379D
Tightly-regulated, isolated output voltages of 15V and –7.7V with better than ±2% load regulation from 1% to 100% load

Texas Instruments UCC5870QEVM-045 Gate Driver Evaluation Module

Features

Bench Setup Configuration

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