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Texas Instruments UCC21755-Q1 Automotive Gate Driver

Texas Instruments UCC21755-Q1 Automotive Gate Driver is designed for SiC MOSFETs and IGBTs up to 2121Vpk. The UCC21755-Q1 offers advanced protection features, best-in-class dynamic performance, and robustness.

The TI UCC21755-Q1 automotive gate driver has up to ±10A peak source and sink current. The input side is isolated from the output side with SiO2 capacitive isolation technology, supporting up to 1.5kVRMS working voltage, 12.8kVPK surge immunity with longer than 40-years isolation barrier life, low part-to-part skew, and >150V/ns common mode noise immunity (CMTI).

The UCC21755-Q1 includes state-of-art protection features, including fast overcurrent and short circuit detection, shunt current sensing support, fault reporting, active Miller clamp, and input and output side power supply UVLO to optimize SiC and IGBT switching behavior.

The isolated analog to PWM sensor can be utilized for more manageable temperature or voltage sensing. These features additionally increase the drivers’ versatility and simplify the system design effort, size, and cost.

Features

  • 5.7kVRMS single-channel isolated gate driver
  • AEC-Q100 Qualified with the following results:
    • Device temperature grade 0: -40°C to +150°C ambient operating temperature range
    • Device HBM ESD classification level 3A
    • Device CDM ESD classification level C6
  • Functional Safety Quality-Managed
    • Documentation available to aid functional safety system design
  • SiC MOSFETs and IGBTs up to 2121Vpk
  • 4A internal active Miller clamp
  • 400mA soft turn-off when fault happens
  • Isolated analog sensor with PWM output for
    • Temperature sensing with NTC, PTC, or thermal diode
    • High voltage DC-link or phase voltage
  • 33V maximum output drive voltage (VDD-VEE)
  • 200ns response time fast DESAT protection with 5V threshold
  • ±10A drive strength and split output
  • 150V/ns minimum CMTI
  • Alarm FLT on overcurrent and reset from RST/EN
  • Fast enable/disable response on RST/EN
  • Reject <40ns noise transient and pulse on input pins
  • 12V VDD UVLO with power good on RDY
  • Inputs/outputs with over- or under-shoot transient voltage immunity up to 5V
  • 130ns (maximum) propagation delay and 30ns (maximum) pulse/part skew
  • SOIC-16 DW package with >8mm creepage and clearance distance
  • Operating junction temperature from –40°C to +150°C

Applications

  • Traction inverter for EVs
  • On-board charger and charging pile
  • DC/DC converter for HEV/EVs

Pin Configuration

Location Circuit - Texas Instruments UCC21755-Q1 Automotive Gate Driver

Texas Instruments UCC21755-Q1 Automotive Gate Driver