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http://www.ti.com/general/docs/suppproductinfo.tsp?distId=26&gotoUrl=https%3A%2F%2Fwww.ti.com%2Flit%2Fgpn%2Fadc32rf54″>View Datasheet
Texas Instruments ADC32RF5x RF Sampling Data Converters are single core 14-bit, 2.6GSPS to 3GSPS, dual channel analog to digital converters (ADC) that support RF sampling with input frequencies up to 3GHz. The design maximizes signal-to-noise ratio (SNR) and delivers a noise spectral density of -155dBFS/Hz. Using additional internal ADCs along with on-chip signal averaging, the noise density improves to -161dBFS/Hz.
Each ADC channel can be connected to a quad-band digital down-converter (DDC) using a 48-bit NCO, which supports phase-coherent frequency hopping. Using the GPIO pins for NCO frequency control, frequency hopping can be achieved in less than 1µs. The Texas Instruments ADC32RF54 and ADC32RF55 support the JESD204B serial data interface with subclass 1 deterministic latency using data rates up to 13Gbps. The power-efficient ADC architecture consumes 2.1W/ch at 3Gsps and provides power scaling with lower sampling rates.
