Apogee Semiconductor AAP54RHC86 Rad-Hard Quad 2-Input XOR Gate ICs are members of the AP54RHC logic family operating across a 1.65V to 5.5V voltage supply range. These AP54RHC86 XOR gate ICs are fabricated in a 180nm CMOS process utilizing proprietary radiation-hardening techniques, delivering high resiliency to Single Event Effects (SEE). A proprietary output stage and robust Power On Reset (POR) circuit allow the AP54RHC86 to be cold-spared in any redundant configuration with no static power loss. The AP54RHC86 XOR gate ICs support zero-power penalty cold-sparing and class 2 ESD protection on all inputs and outputs.
The AP54RHC86 rad-hard quad 2-input XOR gate ICs feature built-in triple redundancy for enhanced reliability, logic-level down translation to VCC, and 30krad (Si) TID resilience. These gates also feature a 17ns propagation delay time and operate between -55°C to 125°C extended operating temperature range. The AP54RHC86 XOR gate ICs provide four instances of the boolean logic function. These AP54RHC86 XOR gate ICs are ideally used in LEO constellations, small satellites, and medical imaging.