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Apogee Semiconductor AP54RHC705 Radiation Hardened Dual D Flip Flops are members of the AP54RHC logic family operating across a 1.65V to 5.5V voltage supply range. These dual D flip flops are fabricated in a 180nm CMOS process utilizing proprietary radiation-hardening techniques, delivering high resiliency to Single Event Effects (SEE). A proprietary output stage and robust Power On Reset (POR) circuit allow the AP54RHC705 to be cold-spared in any redundant configuration with no static power loss. The AP54RHC705 radiation-hardened dual D flip flops support zero-power penalty cold-sparing and class 2 ESD protection on all inputs and outputs.
The AP54RHC705 radiation-hardened dual D flip flops feature built-in triple redundancy for enhanced reliability, logic-level down translation to VCC, and TID resilience of 30krad (Si). These dual D flip flops also feature a 17ns propagation delay time and operate between -55°C to 125°C an extended operating temperature range. The AP54RHC705 dual D flip flops provide four instances of the boolean logic function. These AP54RHC705 dual D flip flops are ideally used in LEO constellations, small satellites, and medical imaging.
