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Apogee Semiconductor AP54RHC32 Rad-Hard Quad 2-Input OR Gate ICs is a member of the AP54RHC logic family operating across a 1.65V to 5.5V voltage supply range. These OR gate ICs are fabricated in a 180nm CMOS process utilizing proprietary radiation-hardening techniques, delivering high resiliency to Single Event Effects (SEE). A proprietary output stage and robust Power On Reset (POR) circuit allow the AP54RHC32 to be cold-spared in any redundant configuration with no static power loss. The AP54RHC32 OR gate ICs support zero-power penalty cold-sparing and class 2 ESD protection on all inputs and outputs.
The AP54RHC32 OR gate ICs feature built-in triple redundancy for enhanced reliability, logic-level down translation to VCC, and TID resilience of 30krad (Si). These OR gate ICs feature a 17ns propagation delay time and operate between -55°C to 125°C an extended operating temperature range. The AP54RHC32 OR gate ICs provide four instances of the boolean logic function. These AP54RHC32 OR gate ICs are ideally used in LEO constellations, small satellites, and medical imaging.
