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Apogee Semiconductor AP54RHC00 Rad-Hard Quad 2-input NAND Gate ICs are members of the AP54RHC logic family operating across a 1.65V to 5.5V voltage supply range. These NAND gate ICs are fabricated in a 180nm CMOS process utilizing proprietary radiation-hardening techniques, delivering high resiliency to Single Event Effects (SEE). A proprietary output stage and robust Power On Reset (POR) circuit allow the AP54RHC00 to be cold-spared in any redundant configuration with no static power loss. The AP54RHC00 NAND gate ICs support zero-power penalty cold-sparing and class 2 ESD protection on all inputs and outputs.
The AP54RHC00 NAND gate ICs feature built-in triple redundancy for enhanced reliability, logic-level down translation to VCC, and TID resilience of 30krad (Si). These gate ICs also feature a 17ns propagation delay time and operate between -55°C to 125°C extended operating temperature range. The AP54RHC00 NAND gate ICs provide four instances of the boolean logic function. These AP54RHC00 NAND gate ICs are ideally used in LEO constellations, small satellites, and medical imaging.
