NXP Semiconductors RDGD3162I3PH5EVB Evaluation Board

NXP Semiconductors RDGD3162I3PH5EVB Evaluation Board is a fully functional three-phase inverter with six GD3162 gate drivers. The drivers have fault management and supporting circuitry. The board supports a serial peripheral interface (SPI) daisy chain communication for programming and communication. It has three high-side gate drivers and three low-side gate drivers independently or all six gate drivers simultaneously.

Features

Capability to perform double pulse and short-circuit tests on phase U using KITGD316xTREVB and FlexGUI; see phase U schematics and FlexGUI pulse tab
Evaluation board was designed for and populated with GD3162 gate drivers and protection circuitry
Capability to connect to HybridPACK drive-type SiC-specific modules for full three-phase evaluation and development
Daisy chain SPI communication × 3 – 2 channels (three high-side gate drivers and three low-side gate drivers) or × 6 – 1 channel (all six gate drivers)

Variable flyback VCC power supply with GND reference and variable negative VEE supply
Easy access to power, ground, and signal test points
2 × 32 Peripheral Component Interconnect Express (PCIe) socket for interfacing MCU control (MPC5775B/E-EVB, MPC5777C-DEVB, or MPC57744P)
Optional connection for DC bus voltage and current monitoring
Phase current feedback connections
Resolver signal connector

NXP Semiconductors RDGD3162I3PH5EVB Evaluation Board

Features

Overview

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