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http://www.ti.com/general/docs/suppproductinfo.tsp?distId=26&gotoUrl=https%3A%2F%2Fwww.ti.com%2Flit%2Fpdf%2Fsluucs3″>View Datasheet
Texas Instruments LM2105EVM Driver Evaluation Module (EVM) is designed to evaluate the LM2105 performance primarily. The LM2105 is a 105V boot voltage, high-side, low-side driver with a 0.5A peak source and 0.8A sink current for driving two N-channel MOSFETs. The same board can be used to evaluate other pin-to-pin compatible parts in the supported package. The LM2105 has low propagation delay and low propagation delay matching between the driver outputs’ high- and low-side rising and falling edges for reliable timing of the gate-drive signals.
The Texas Instruments LM2105EVM can evaluate the LM2105 and compare it to the datasheet parameters or externally connected to power devices with source and sink gate resistance flexibility provisions. The LM2105EVM evaluation board uses surface-mount test points allowing connection to INL, INH, GVDD, and BST inputs. A variety of other test points are available for probing the LM2105. The input bias is configured such that the BST-SH high-side bias can be sourced from GVDD, or an additional external bias can be added to provide BST-SH directly. The high- and low-side driver output returns are separated on SH and GND, respectively, to allow evaluation of the LM2105 SH negative voltage capabilities.
