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Texas Instruments DLPLCR55EVM Evaluation Module

Texas Instruments DLPLCR55EVM Evaluation Module features the DLP5500 0.55″ 2 x LVDS DMD, including 1024 x 768 micromirrors with 10.8µm pitch. Users can combine the DLPLCR55EVM and DLPLCRC900EVM to get a pixel-accurate control with 1-bit pattern rates up to 5,000Hz.

The TI DLPLCR55EVM is ideal for designers requiring the highest resolution DMD and advanced pattern control.

Features

Targets 420nm to 700nm with 1-bit pattern rates up to 5,000Hz
DLP5500 DMD has 1024 x 768 mirrors with 10.8µm pitch
DMD board with holes for convenient mounting

One 12″ flex cable for flexible positioning of the DMD on a benchtop

Applications

Structured light applications
- Factory automation and 3D machine vision
- In-line automated optical 3D inspection
- Robotic 3D vision
- Offline 3D metrology
- 3D scanners
- 3D identification and biometrics

3D printing and additive manufacturing
Medical and life sciences
High-speed imaging and display

Kit Contents

DLPLCR55EVM Evaluation Module
Flex cable

Texas Instruments DLPLCR55EVM Evaluation Module

Features

Applications

Kit Contents

Layout

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